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Research



Nanomanipulation of biological material

Nanomanipulation based on AFM has some limitations, mainly due to its low speed and restricted range of operation. The manipulation performance can be greatly enhanced by combining AFM with other methods such as optical microscopy, UV-laser ablation, automated lithography control and haptic interfacing.

Nanomanipulator

Draft of the AFM based NanoManipulator developed in our group


ChromoCut

Precise dissection of human methaphase chromosomes. (a) Topography and (b) cross sectional analysis of the cuts


Selected publications

  1. R.W. Stark: "Nanomanipulation and Nanorobotics with the atomic force microscope", in: Handbook of Nanophysics, K. Sattler (Ed), in press.
  2. F. J. Rubio-Sierra, W. M. Heckl, R. W. Stark (2005): Nanomanipulation by Atomic Force Microscopy, Adv. Eng. Materials, 7 (4), p. 193-196, doi: http://dx.doi.org/10.1002/adem.200400174
  3. F.J. Rubio-Sierra, R.W. Stark, S. Thalhammer, W.M. Heckl (2003): Force feedback joystick as a low cost haptic interface for an atomic force microscopy nanomanipulator, Appl. Phys. A, 76, p. 903-906, doi:10.1007/s00339-002-1973-8
  4. R. W. Stark, F.-J. Rubio-Sierra, S. Thalhammer, W. M. Heckl (2003), Combined nanomanipulation by atomic force microscopy and UV-laser ablation for chromosomal dissection, Eur. Biophys. J. 32 (1), pp 33-39, doi: 10.1007/s00249-002-0270-y
  5. R.W. Stark, S. Thalhammer, J. Wienberg, W.M. Heckl (1998): The AFM as a tool for chromosomal dissection – the influence of physical parameters, Appl. Phys. A 66, p. S579-S584 doi: 10.1007/s003390051205
  6. S. Thalhammer, R.W. Stark, S. Müller, J Wienberg, W.M. Heckl (1997): The Atomic Force Microscope as a New Microdissecting Tool for the Generation of Genetic Probes, J. Struct. Biol. 119, p. 232-237, doi: 10.1006/jsbi.1997.3869


Dynamic nano-sensing for the characterization of soft matter

Analyzing the response of vibrating AFM cantilevers for the characterization of single biomolecules and polymers

The transfer function approach is a straightforward method to analyze the AFM dynamics considering all resonance modes of the cantilever. We study standard configurations of the AFM system with different actuation inputs and measurement outputs, including a linearized tip-sample interaction force. The transfer functions are used in the quantitative analysis of AFM force spectroscopy experiments and for model based control of the AFM for robotic operation of the system.


force spectroscopy I/O

Scheme of the I/O configuration of an single molecule force pulling experiment.



Selected publications

  1. O. von Sicard, A.M. Gigler, T. Drobek, R. W. Stark, "Torsional noise of a colloidal probe in contact with surface-grafted PEG layers", Langmuir, vol. 25 (5), pp 2924–2927, 2009; doi:10.1021/la8038329
  2. C. Dietz, M. Zerson, C. Riesch, A. M. Gigler, R.W. Stark, N. Rehse, R. Magerle, "Nanotomography with enhanced resolution using bimodal atomic force microscopy", Appl. Phys. Lett. vol. 92, art. 143107, 2008, doi: 10.1063/1.2907500
  3. R. Vázquez, F.J. Rubio-Sierra, R.W. Stark,"Multimodal analysis of force spectroscopy based on a transfer function study of micro-cantilevers", Nanotechnology, vol. 18, art. 185504, 2007 doi:10.1088/0957-4484/18/18/185504
  4. F. J. Rubio-Sierra, R. Vazquez, and R. W. Stark, "Transfer Function Analysis of the Micro Cantilever used in Atomic Force Microscopy", IEEE T. Nanotechnology, vol. 5(6), pp 692-700, 2006, doi: 10.1109/TNANO.2006.883479
  5. M. Stark, R. Guckenberger, A. Stemmer, R.W. Stark, “Estimating the transfer function of the cantilever in atomic force microscopy: a system identification approach”, J. Appl. Phys., 98, 114904, 2005, doi:10.1063/1.2137887



Friction on the nanometer scale: shear force microscopy by torsional resonance AFM imaging


LexA-DNA

DNA-protein complex (LexA) imaged in torsional resonance mode AFM.

Torsional resonance mode (TR-mode, Veeco) is a measurement mode in atomic force microscopy which is based on lateral forces between the probe tip and sample surface. Utilizing advanced sensing hardware and electronics to characterize torsion oscillations of the cantilever, TR mode enables detailed, nanoscale examination of in-plane anisotropy, and provides new perspectives in the study of material structures and properties. Dynamic tip-sample interaction of TR-mode AFM is mainly in-plane (or lateral), which sets the method apart from the other primary imaging modes whose dynamic tip-sample interactions are mainly vertical, or out-of-plane. TR-mode AFM is sensitive to differences that arise in lateral tip-sample interaction strengUnbenannt1th at the same sample location when the in-plane orientation of the sample is changed. In other words, TR-mode can detect differences in tip-sample interaction that indicate azimuthal anisotropy on or near the sample surface. In our research group, we are trying to understand the mechanical response of the cantilever under surface coupled visco-elastic interaction during the imaging and the manipulation. We have calculated the transfer function of the system by using the finite element analysis (FEA).

 

Selected publications

  1. A. Yurtsever, A.M. Gigler, R.W. Stark, "Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface", Ultramicroscopy, vol. 109 (3), pp. 275-279, 2009; doi:10.1016/j.ultramic.2008.11.016
  2. A. Yurtsever, A. M. Gigler, C. Dietz, R.W. Stark, "Frequency modulated torsional resonance mode atomic force microscopy on polymers", Appl. Phys. Lett., vol. 92, art. 143103, 2008, doi: 10.1063/1.2907498
  3. G. Weissmüller, A. Yurtsever, L. T. Costa, A. B. F. Pacheco, P. M. Bisch, W. M. Heckl, R. W. Stark, "Torsional resonance mode atomic force microscopy of a protein-DNA complex", Nano, vol. 3, iss. 6, pp 443-448 doi: 10.1142/S1793292008001374
  4. A. Yurtsever, A. M. Gigler, E. Macias, R. W. Stark: Response of a laterally vibrating nano-tip to surface forces, Appl. Phys. Lett., vol. 91, art. 253120, 2007, doi: 10.1063/1.2826285
  5. T. Drobek, R.W. Stark, W.M. Heckl (2001): Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy, Phys. Rev. B, 64, 045401, doi: 10.1103/PhysRevB.64.045401
  6. T. Drobek, R.W. Stark, M. Gräber, W.M. Heckl, (1999): Overtone atomic force microscopy studies of decagonal quasicrystal surfaces, New Journal of Physics 1, Art 15 doi:10.1088/1367-2630/1/1/315


Tip-based nanofabrication

Engineering and farbrication of smallest structures is of increasing importance for the development of new device technologies. The atomic force microscopy (AFM) provides a powerful and versatile tool for nanoscale fabrication. Based on the AFM anodic oxidation technique, we have generated various nanoscale oxide structures on semiconductor and self-assembled monolayer covered surfaces.

nano

Different types of oxide patterns generated on bare and self- assembled monolayer covered silicon surfaces for nano fabrication.

dots

AFM images of oxide dots fabricated by local anodic oxidation.

Selected publications

  1. F. J. Rubio-Sierra, A. Yurtsever, M. Hennemeyer, W.M. Heckl, and R.W. Stark, “Acoustical force nano-lithography of thin polymer films“, physica status solidi (a), vol. 203 (6), pp. 1481-1486, 2006, doi: 10.1002/pssa.200566152
  2. R. W. Stark, N. Naujoks, and A. Stemmer, "Multifrequency electrostatic force microscopy in the repulsive regime", Nanotechnology, vol. 18, Art. 065502, 2007, doi:10.1088/0957-4484/18/6/065502

 



Materials

Altered mineral surfaces


KBr1

KBr(001) surface of a freshly cleaved crystal after 1s incubation in a saturated KBr-KCl solution
(image size 3 µm x 3 µm x 9 nm).



Thin films


InSi111

Indium islands grown on Si(111) (image size 3 µm x 3 µm x 330 nm).

selected publications

  1. M. Bauer, A.M. Gigler, C. Richter, R.W. Stark: "Visualizing stress in silicon microcantilevers using scanning confocal Raman spectroscopy", Microelectr. Eng. vol. 85 (5-6) pp 1443-1446, 2008, doi: 10.1016/j.mee.2008.01.089
  2. S. Shimizu, T. Shimizu, B. M. Annaratone, W. Jacob, C. Linsmeier, S. Lindig, R. W. Stark, F. Jamitzky, H. Thomas, N. Sato and G. E. Morfill "The approach to diamond growth on levitating seed particles", Appl. Surf. Sci., vol. 254, 177-180, 2007, doi:10.1016/j.apsusc.2007.07.017
  3. N. M. Jeutter, M. Hennemeyer, R. Stark, A. Stierle, and W. Moritz, "Growth of epitaxial Pr2O3 layers on Si(1 1 1)", Materials Science in Semiconductor Processing, vol. 9, pp. 1079 - 1083, 2006, doi:10.1016/j.mssp.2006.10.045 .
  4. M. Mayer, R. Fischer, S. Lindig, U. von Toussaint , R. W. Stark, V. Dose (2005): Bayesian reconstruction of surface roughness and depth profiles, Nucl. Instr. Meth. Phys. Res. B, 228, p. 349-359 doi:10.1016/j.nimb.2004.10.069


Biological imaging


Chromosomes and DNA


chromosSmall

Human metaphase chromosomes (image size 20 µm x 20 µm x 500 nm).



selected publications

  1. G. Weissmüller, A. Yurtsever, L. T. Costa, A. B. F. Pacheco, P. M. Bisch, W. M. Heckl, R. W. Stark, "Torsional resonance mode atomic force microscopy of a protein-DNA complex", Nano, vol. 3, iss. 6, pp 443-448 doi: 10.1142/S1793292008001374
  2. G. Schitter, R. W. Stark, A. Stemmer (2004): Fast contact-mode atomic force microscopy on biological specimen by model-based control, Ultramicroscopy 100 (3-4), pp. 253-257, doi: 10.1016/j.ultramic.2003.11.008
  3. S. Thalhammer, U. Köhler, R.W. Stark, W.M. Heckl (2001), J. Microscopy, 202(3), pp. 464-467, doi: 10.1046/j.1365-2818.2001.00909.x




Adhesion of platelets


Thrombo


AFM image of a thrombocyte (platelet) on a glass surface that was functionalized with von Willebrand factor (glycoprotein). The cell was allowed to adhere under arterial shear conditions (flow from the left).

 


Nanodynamics

Unraveling the non-linear dynamics of atomic force microscopy

The highly nonlinear tip–sample interaction gives rise to a complicated dynamics of the microcantilever in dynamic atomic force microscopy. Apart from the well-known bistability under typical imaging conditions the system exhibits a complex dynamics at small average tip–sample distances, which are typical operation conditions for mechanical dynamic nanomanipulation. In order to investigate the dynamics at small average tip sample gaps experimental time series data are analysed employing nonlinear analysis tools and spectral analysis. The analysis reveals period-3, period-2 and period-4 behaviour, as well as a weakly chaotic regime.

Fig5

The three dimensional phase space embeddings were generated using a delay time of T/2 and T/4. The colours reflect the local correlation dimension D2 where blue indicates values near one while red indicates values near two. The panels correspond to the attractive regime(a), the repulsive regime(b), period-3(c), period-2(d), period-4(e) and finally chaos (f) of the system.

Selected publications

  1. R. W. Stark "Dynamics of repulsive dual frequency atomic force microscopy", Appl. Phys. Lett., vol. 94, art. 063109, 2009; doi:10.1063/1.3080209
  2. F. Jamitzky, M. Stark, W. Bunk, W.M. Heckl, and R.W. Stark, Nanotechnology, vol. 17, pp. S213-S220, 2006, doi:10.1088/0957-4484/17/7/S19. (Highlighted in: M.C. Hersam, Small, vol. 2, Iss. 10, pp 1122-1124, doi:10.1002/smll.200600272.)
  3. R. W. Stark (2004): Optical lever detection in higher eigenmode dynamic atomic force microscopy, Rev. Sci. Instrum., 75 (11), pp. 5053-5055 doi:10.1063/1.1808058
  4. R. W. Stark, G. Schitter, M. Stark, R. Guckenberger, A. Stemmer (2004): State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy, Phys. Rev. B, 69 (8) 085412, doi:10.1103/PhysRevB.69.085412 (animation).
  5. R. W. Stark (2004): Spectroscopy of higher harmonics in dynamic atomic force microscopy, Nanotechnology 15 (3), pp. 347-351 doi: 10.1088/0957-4484/15/3/020.



Confocal Raman spectroscopy


Soft matter


HeLaWeb

Confocal Raman image of a cell. The colors code for different spectral regions.




Solid matter


StressSi

Micro-Raman measurement of stress in a silicon microstructure (color scale Raman shift -2 cm-1 (green) ... +2cm-1 (yellow))

selected publications

  1. M. Bauer, A. M. Gigler, A. Huber, R. Hillenbrand, R. W. Stark, "Temperature depending Raman line-shift of silicon carbide", J. Raman Spetrosc. doi: 10.1002/jrs.2334.
  2. M. Bauer, M. Bischoff, S. Jukresch, T. Hülsenbusch, A. Matern, A. Görtler, R. W. Stark, A. Chuvilin, U. Kaiser, "Exterior surface damage of calcium fluoride outcoupling mirrors for DUV lasers", Optics Express, vol. 17 (10), pp. 8253–8263, 2009; doi:10.1364/OE.17.008253
  3. M. Bauer, A.M. Gigler, C. Richter, R.W. Stark: "Visualizing stress in silicon microcantilevers using scanning confocal Raman spectroscopy", Microelectr. Eng. vol. 85 (5-6) pp 1443-1446, 2008, doi: 10.1016/j.mee.2008.01.089
  4. S. Shimizu, T. Shimizu, B. M. Annaratone, W. Jacob, C. Linsmeier, S. Lindig, R. W. Stark, F. Jamitzky, H. Thomas, N. Sato and G. E. Morfill "The approach to diamond growth on levitating seed particles", Appl. Surf. Sci., vol. 254, 177-180, 2007, doi:10.1016/j.apsusc.2007.07.017

Outreach

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Dr. Robert Stark © 2009 - Impressum