60. O. von Sicard, A.M. Gigler, T. Drobek, R. W. Stark, "Torsional noise of a colloidal probe in contact with surface-grafted PEG layers", Langmuir, vol. 25 (5), pp 2924–2927, 2009; doi: 10.1021/la8038329 (preprint).

59. A. M. Gigler, A. J. Huber, M. Bauer, A. Ziegler, R. Hillenbrand, R. W. Stark "Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy", Optics Express, vol. 17 (25), pp. 22351–22357, 2009; doi: 10.1364/OE.17.022351 open access

58. R. W. Stark "Dynamics of repulsive dual frequency atomic force microscopy", Appl. Phys. Lett., vol. 94, art. 063109, 2009; doi: 10.1063/1.3080209 (pdf ©2009 AIP *).

57. M. Bauer, M. Bischoff, T. Hülsenbusch, A. Matern, R. W. Stark, N. Kaiser, "Onset of the optical damage in CaF2 optics caused by DUV lasers", Optics Letters, vol. 34, Iss. 24,pp. 3815-3817, 2009; doi: 10.1364/OL.34.003815

56. M. Bauer, M. Bischoff, S. Jukresch, T. Hülsenbusch, A. Matern, A. Görtler, R. W. Stark, A. Chuvilin, U. Kaiser, "Exterior surface damage of calcium fluoride outcoupling mirrors for DUV lasers", Optics Express, vol. 17 (10), pp. 8253–8263, 2009; doi: 10.1364/OE.17.008253 open access

55. M. Bauer, A. M. Gigler, A. Huber, R. Hillenbrand, R. W. Stark, "Temperature depending Raman line-shift of silicon carbide", J. Raman Spetrosc., vol. 40 (12), pp. 1867 - 1874, 2009; doi: 10.1002/jrs.2334.

54. R. Pompl, F. Jamitzky, T. Shimizu, B. Steffes, W. Bunk, H. Schmidt, M. Georgi, K. Ramrath, W. Stolz, R. W Stark, T. Urayama, S. Fujii and G. Morfill, "Effect of low-temperature plasma on bacteria observed by repeated AFM-imaging", New J. Phys., vol. 11, art. 115023, 2009. doi: 10.1088/1367-2630/11/11/115023 open access

53. T. Wei, J. Gong, F. Jamitzky, W. M. Heckl, R. W. Stark, S. C. Rössle, "Homology modeling of human Toll-like receptors TLR7, 8, and 9 ligand-binding domains", Protein Sci., vol. 18, pp. 1684—1691, 2009; doi: 10.1002/pro.186

52. A. Yurtsever, A.M. Gigler, R.W. Stark, "Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface", Ultramicroscopy, vol. 109 (3), pp. 275-279, 2009; doi: 10.1016/j.ultramic.2008.11.016 (preprint).

51. R.W. Stark, "Topography-induced forces in amplitude modulated dynamic atomic-force microscopy", J. Scann. Probe Microsc. vol. 4, pp. 1-6, 2009; doi: 10.1166/jspm.2009.1001

2007

42. A. Yurtsever, A. M. Gigler, E. Macias, R. W. Stark: Response of a laterally vibrating nano-tip to surface forces, Appl. Phys. Lett., vol. 91, art. 253120, 2007, doi: 10.1063/1.2826285 (pdf ©2007 AIP *) open access

41. R. W. Stark, "Atomic force microscopy: Getting a feeling for the nanoworld", Nature Nanotechnology, pp. 461 - 462, 2007 doi:10.1038/nnano.2007.233 (News and Views article)

40. S. Shimizu, T. Shimizu, B. M. Annaratone, W. Jacob, C. Linsmeier, S. Lindig, R. W. Stark, F. Jamitzky, H. Thomas, N. Sato and G. E. Morfill "The approach to diamond growth on levitating seed particles", Appl. Surf. Sci., vol. 254, 177-180, 2007, doi:10.1016/j.apsusc.2007.07.017

39. R. Vázquez, F.J. Rubio-Sierra, R.W. Stark,"Multimodal analysis of force spectroscopy based on a transfer function study of micro-cantilevers", Nanotechnology, vol. 18, art. 185504, 2007 doi:10.1088/0957-4484/18/18/185504 (pdf ©2007 IOP).

38. F. Walther, P. Davydovskaya, S. Zürcher, M. Kaiser, H. Herberg, A. M. Gigler, and R. W. Stark, "Stability of the hydrophilic behaviour of oxygen plasma activated SU-8", J. Micromech. Microeng., vol 17, pp. 524-531, 2007, doi:10.1088/0960-1317/17/3/015, (preprint).

37. R. W. Stark, N. Naujoks, and A. Stemmer, "Multifrequency electrostatic force microscopy in the repulsive regime", Nanotechnology, vol. 18, Art. 065502, 2007, doi:10.1088/0957-4484/18/6/065502 (pdf ©2007 IOP).

2006

36. N. M. Jeutter, M. Hennemeyer, R. Stark, A. Stierle, and W. Moritz, "Growth of epitaxial Pr2O3 layers on Si(1 1 1)", Materials Science in Semiconductor Processing, vol. 9, pp. 1079 - 1083, 2006, doi:10.1016/j.mssp.2006.10.045 .

35. F. J. Rubio-Sierra, R. Vazquez, and R. W. Stark, "Transfer Function Analysis of the Micro Cantilever used in Atomic Force Microscopy", IEEE T. Nanotechnology, vol. 5(6), pp 692-700, 2006, doi: 10.1109/TNANO.2006.883479 (pdf ©2006 IEEE).

34. F. J. Rubio-Sierra, A. Yurtsever, M. Hennemeyer, W.M. Heckl, and R.W. Stark, “Acoustical force nano-lithography of thin polymer films“, physica status solidi (a), vol. 203 (6), pp. 1481-1486, 2006, doi: 10.1002/pssa.200566152 (preprint).

33. F. Jamitzky, M. Stark, W. Bunk, W.M. Heckl, and R.W. Stark, “Chaos in dynamic atomic force microscopy”, Nanotechnology, vol. 17, pp. S213-S220, 2006, doi:10.1088/0957-4484/17/7/S19 (pdf ©2006 IOP). Highlighted in: M.C. Hersam, Small, vol. 2, Iss. 10, pp 1122-1124, doi:10.1002/smll.200600272.

2005

32. M. Stark, R. Guckenberger, A. Stemmer, R.W. Stark, “Estimating the transfer function of the cantilever in atomic force microscopy: a system identification approach”, J. Appl. Phys., 98, 114904, 2005, doi:10.1063/1.2137887 (pdf ©2005 AIP *).

31. A. Kempe, R. Wirth, W. Altermann, R. W. Stark, J. W. Schopf, W. M. Heckl (2005): Focussed Ion Beam Preparation and in Situ Nanoscopic Study of Precambrian Acritarchs, Precambrian Research, 140, pp. 36-54, doi: 10.1016/j.precamres.2005.07.002.

30. F. J. Rubio-Sierra, W. M. Heckl, R. W. Stark (2005): Nanomanipulation by Atomic Force Microscopy, Adv. Eng. Materials, 7 (4), p. 193-196, doi: 10.1002/adem.200400174 (preprint).

29. M. Mayer, R. Fischer, S. Lindig, U. von Toussaint , R. W. Stark, V. Dose (2005): Bayesian reconstruction of surface roughness and depth profiles, Nucl. Instr. Meth. Phys. Res. B, 228, p. 349-359 doi:10.1016/j.nimb.2004.10.069 (preprint).

2004

28. R. W. Stark (2004): Optical lever detection in higher eigenmode dynamic atomic force microscopy, Rev. Sci. Instrum., 75 (11), pp. 5053-5055 doi:10.1063/1.1808058 (pdf ©2004 AIP *).

27. R. W. Stark, G. Schitter, A. Stemmer (2004): Velocity dependent friction laws in contact mode atomic force microscopy, Ultramicroscopy 100 (3-4), pp. 309-317, doi: 10.1016/j.ultramic.2003.11.011 (preprint).

26. G. Schitter, R. W. Stark, A. Stemmer (2004): Fast contact-mode atomic force microscopy on biological specimen by model-based control, Ultramicroscopy 100 (3-4), pp. 253-257, doi: 10.1016/j.ultramic.2003.11.008 (preprint).

25. R. W. Stark, G. Schitter, M. Stark, R. Guckenberger, A. Stemmer (2004): State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy, Phys. Rev. B, 69 (8) 085412, doi:10.1103/PhysRevB.69.085412 (animation, pdf ©2004 APS).

24. R. W. Stark (2004): Spectroscopy of higher harmonics in dynamic atomic force microscopy, Nanotechnology 15 (3), pp. 347-351 doi: 10.1088/0957-4484/15/3/020 (pdf ©2004 IOP).

2003

23. R. W. Stark, W. M. Heckl (2003): Higher harmonics imaging in tapping mode atomic force microscopy, Rev. Sci. Instrum. 74 (12), pp. 5111-5114 doi:10.1063/1.1626008 (pdf ©2003 AIP *).

22. R. W. Stark, G. Schitter, A. Stemmer (2003): Tuning the interaction forces in tapping mode atomic-force microscopy, Phys. Rev. B, 68, 085401, doi:10.1103/PhysRevB.68.085401 (pdf ©2003 APS).

21. R. W. Stark, M. Sakai Stalder, A. Stemmer (2003): Microfluidic etching driven by capillary forces for rapid prototyping of gold structures, Microelectr. Eng., 67-68, pp. 229-236, doi:10.1016/S0167-9317(03)00076-5 (preprint).

20. F.J. Rubio-Sierra, R.W. Stark, S. Thalhammer, W.M. Heckl (2003): Force feedback joystick as a low cost haptic interface for an atomic force microscopy nanomanipulator, Appl. Phys. A, 76, p. 903-906, doi:10.1007/s00339-002-1973-8 (preprint).

19. R. W. Stark, F.-J. Rubio-Sierra, S. Thalhammer, W. M. Heckl (2003), Combined nanomanipulation by atomic force microscopy and UV-laser ablation for chromosomal dissection, Eur. Biophys. J. 32 (1), pp 33-39, doi: 10.1007/s00249-002-0270-y (preprint).

2002

 

18. M. Stark, R. W. Stark, W. M. Heckl, R. Guckenberger (2002): Inverting dynamic force microscopy: From signals to time-resolved interaction forces, Proc. Natl. Acad. Sci. USA, 99 (13), pp 8473-8478 doi:10.1073/pnas.122040599 (pdf ©2002 Natl. Acad. Sci.USA).

17. G. Schitter, R. W. Stark, A. Stemmer (2002): Sensors for closed-loop piezo control: strain gauges versus optical sensors, Meas. Sci. Technol. 13, pp. N47-N48, doi: 10.1088/0957-0233/13/4/404 (pdf ©2002 IOP).

2001

16. T. Drobek, R.W. Stark, W.M. Heckl (2001): Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy, Phys. Rev. B, 64, 045401, doi: 10.1103/PhysRevB.64.045401 (pdf ©2001 APS).

15. R.W. Stark, T. Drobek, W.M. Heckl (2001): Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy, Ultramicroscopy 86 (1-2), pp 207-215, doi: 10.1016/S0304-3991(00)00077-2 (preprint).

14. F. Jamitzky, R.W. Stark, W. Bunk, S. Thalhammer, C. Räth, T. Aschenbrenner, G.E. Morfill, W.M. Heckl (2001): Scaling-index method as an image processing tool in scanning-probe microscopy, Ultramicroscopy, 86 (1-2), pp 241-246, doi: 10.1016/S0304-3991(00)00111-X .

13. S. Thalhammer, U. Köhler, R.W. Stark, W.M. Heckl (2001): GTG banding pattern on human metaphase chromosomes revealed by atomic force microscopy, J. Microscopy, 202(3), pp. 464-467, doi: 10.1046/j.1365-2818.2001.00909.x .

12. M. Stark, R. W. Stark, W. M. Heckl, R. Guckenberger (2000): Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic force microscopy, Appl. Phys. Lett, 77 (20), pp 3293-3295, doi: 10.1063/1.1325404 (pdf ©2000 AIP *).

11. R. W. Stark and W. M. Heckl (2000): Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation, Surf. Sci. 457 (1-2), p. 219-228 doi: 10.1016/S0039-6028(00)00378-2 (preprint).

10. P. Gobbi, S. Thalhammer, M. Falconi, R.W. Stark , W. M. Heckl, G. Mazzotti (2000): Correlative high resolution morphologic analysis of the three-dimensional organization of human chromosomes, Scanning 22 (5), p. 273-281 doi: 10.1002/sca.4950220501.

9. H. Göttlich, R. W. Stark, J. D. Pedarnig, W. M. Heckl (2000): Noncontact scanning force microscopy based on modified tuning fork sensor, Rev. Sci. Instr., 71 (8), p. 3104-3107 doi: 10.1063/1.1304881 (pdf ©2000 AIP *).

1999

8. R. W. Stark, T. Drobek, W. M. Heckl (1999): Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes, Appl. Phys. Lett. 74 (22) p. 3296-3298, doi: 10.1063/1.123323 (pdf ©1999 AIP *).

7. T. Drobek, R.W. Stark, M. Gräber, W.M. Heckl, (1999): Overtone atomic force microscopy studies of decagonal quasicrystal surfaces, New Journal of Physics 1, Art 15 doi:10.1088/1367-2630/1/1/315 (pdf). open access

1998

 

6. F. Jamitzky, R.W. Stark, G. Morfill, W.M. Heckl (1998): Decomposition of atomic force microscopy images using the scaling index method for the investigation of DNA, J. Computer-Assisted Micr. 10 (2), pp. 57-62 doi: 10.1023/A:1023372420594 (Kluwer, preprint)

5. R.W. Stark, T. Drobek, M. Weth, J. Fricke, W.M. Heckl (1998): Determination of elastic properties of single aerogel powder particles with the AFM, Ultramicroscopy 75(3) p. 161-169, doi: 10.1016/S0304-3991(98)00061-8 .

4. R.W. Stark, S. Thalhammer, J. Wienberg, W.M. Heckl (1998): The AFM as a tool for chromosomal dissection – the influence of physical parameters, Appl. Phys. A 66, p. S579-S584 doi: 10.1007/s003390051205 (Springer).

1997

3. S. Thalhammer, R.W. Stark, S. Müller, J Wienberg, W.M. Heckl (1997): The Atomic Force Microscope as a New Microdissecting Tool for the Generation of Genetic Probes, J. Struct. Biol. 119, p. 232-237, doi: 10.1006/jsbi.1997.3869 .

2. S. Thalhammer, R.W. Stark, K. Schütze, J. Wienberg, W.M. Heckl, (1997): Laser Microdissection of Metaphase chromosomes and characterization by atomic force microscopy, J. Biomed. Opt. 2 (1), p. 115 – 119, doi: 10.1117/12.259626, SPIE .

1. K. Schütze, I. Becker, K.-F. Becker, S. Thalhammer, R. Stark, W.M. Heckl, H. Pösl (1997), Cut out or poke in – the key to the world of single genes: laser micromanipulation as a valuable tool on the look out for the origin of disease, Gen. Analysis: Biomol. Eng. 14, p. 1-8 doi: 10.1016/S1050-3862(96)00169-6 .

21. F. Jamitzky, R. W. Stark, "Intermittency in dynamic atomic force microscopy", International Symposium on Nonlinear Theory and its Applications NOLTA, Bologna, Italy 2006, pp. 915-918.

20. F. Walther, S. Zürcher, M. Hennemeyer, M. Kaiser, H. Herberg, R. W. Stark, “Hydrophobic recovery of SU-8 after O2-plasma treatment”, Int. Workshop on Nanomechanical Sensors, Copenhagen, Denmark, May 7-10, 2006, pp. 52-53.

19. M. Hennemeyer, S. Burghardt, and R.W. Stark, “Low Cost cantilever Rheometer”, Int. Workshop on Nanomechanical Sensors, Copenhagen, Denmark, May 7-10, 2006, pp. 110-111.

18. R. Vazquez, F.J. Rubio-Sierra, and R.W. Stark, “Transfer Function Analysis of a Surface Coupled Atomic Force Microscope”, American Control Conference 2006, Minneapolis, USA, 6pp. doi: 10.1109/ACC.2006.1655411.

2005

17. F. Jamitzky, W. Bunk, and R.W. Stark, ” The Influence of Q-Control on the Non-linear Dynamics of Amplitude Modulation Atomic Force Microscopy”, International Symposium on Nonlinear Theory and its Applications NOLTA, Brugge, Belgium 2005.

16. R.W. Stark, “Force feedback in dynamic atomic force microscopy”, ASME international mechanical engineering conference and exhibition 2005, IMECE, Orlando, FL, USA.

15. R. Vazquez, F.J. Rubio-Sierra, and R.W. Stark, “Transfer function analysis of atomic force microscope cantilevers”, ASME international mechanical engineering conference and exhibition 2005, IMECE, Orlando, FL, USA.

14. R. W. Stark, N. Naujoks, A. Stemmer, “Detection of Injected Charges by Kelvin Probe and Multi-mode Electrostatic Force Microscopy”, 5th IEEE Conf. Nanotechnology, Nagoya, Japan, pp. 879-882, 2005 (ISBN 0-7803-9199-3).

13 . R. W. Stark, “Time Delay Q-Control of the Microcantilever in Dynamic Atomic Force Microscopy”, 5th IEEE Conf. Nanotechnology, Nagoya, Japan, pp. 413-416, 2005 (ISBN 0-7803-9199-3).

2004

12. F. Jamitzky, M. Stark, W. Bunk, W. M. Heckl, R. W. Stark (2004): Nonlinear dynamics of a microcantilever in close proximity to a surface , Proc. 2004 4th IEEE Conf. Nanotechnology, 17.-19. Aug Munich, Germany, p. 38-40 (pdf ©2004 IEEE, IEEE).

11. M. Stark, R. Guckenberger, A. Stemmer, R. W. Stark (2004): Estimation of the transfer function of a microcantilever used in atomic-force microscopy, Proc. 2004 4th IEEE Conf. Nanotechnology, 17.-19. Aug Munich, Germany, p. 155-157 (pdf ©2004 IEEE, IEEE).

10. F. J. Rubio-Sierra, S. Burghardt, A. Kempe, W. M. Heckl, and R. W. Stark (2004): Atomic force microscope based nanomanipulator for mechanical and optical lithography, Proc. 2004 4th IEEE Conf. Nanotechnology, 17.-19. Aug Munich, Germany, p. 468-470 (pdf ©2004 IEEE, IEEE).

9. F. J. Rubio-Sierra, S. Burghardt, W. M. Heckl, R. Stark (2004): Atomic Force Microscope as a tool for nanomanipulation, Actuator 2004, 9th Int. Conf. on New Actuators, Conference Proceeding, 2004; Bremen, Germany

2003

8. R. W. Stark (2005): Dynamic force spectroscopy: Looking at the total harmonic distortion, in: Recent Advances in Multidisciplinary Applied Physics - Proc. 1st Int. Meeting on Applied Physics 2003 (aphys2003), Badajoz, Spain, pp. 427-431, ISBN 0-08-044648-5 (preprint, oai:arXiv.org:physics/0501061).

7. R. W. Stark, G. Schitter, A. Stemmer (2003): Tuning Tip-sample forces in dynamic atomic force microscopy, Proc. 12th Int. Conf. on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques 2003 (STM'03), Eindhoven, Netherlands, pp 377-384 (pdf ©2003 AIP, AIP Proceedings No 696).

6. R. W. Stark, G. Schitter, M. Stark, R. Guckenberger, A. Stemmer (2004): Towards time-resolved dynamic atomic force microscopy: A state space model for the AFM, in Acoustical Imaging, Vol. 27, Edited by W. Arnold and S. Hirsekorn, Kluwer Academic/Plenum Publishers, Dordrecht & New York, pp. 741-748, ISBN 1-4020-2402-9.

1998-2002

5. G. Schitter, R. W. Stark, A. Stemmer (2002): Fast feedback control of piezoelectric actuators, Actuator 2002, 8th Int. Conf. on New Actuators, Conference Proceeding, 2002; Bremen, pp. 430-433, Germany (pdf).

4. R. W. Stark, J. Rubio, S. Thalhammer, W.M. Heckl (2002): Extraction and manipulation of biological specimen combining UV-laser-ablation and atomic-force microscopy, Actuator 2002, 8th Int. Conf. on New Actuators, Conference Proceeding, 2002; pp. 117-120, Bremen, Germany (pdf).

3. R.W. Stark, G. Schitter, J. Rubio, S. Thalhammer, A. Stemmer, W.M. Heckl (2001): Nanohandling and manipulation of biological specimen by atomic-force microscopy, Europ. Cells & Mat. p. 90 (pdf).

2. R. Kamischke, F. Kollmer, H. Fuchs, R. Stark, W. Heckl, A. Benninghoven (2000): Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS, Proceedings of the XII conference on secondary ion mass spectroscopy SIMS XII, (Brüssel, 1999), p. 9-12.

1. F. Westall, P. Gobbi, G. Mazzotti, D. Gerneke, R.W. Stark, T. Drobek, W.M. Heckl, E. Gibson, D. McKay, C. Allen, A. Steel, K. Thomas-Keprta, (1998): Combined SEM (secondary electrons, backscatter, cathodoluminescence) and atomic force microscope investigation of the carbonate globules in Martian meteorite ALH84001: preliminary results, Proceedings of SPIE - Volume 3441 Instruments, Methods, and Missions for Astrobiology, Richard B. Hoover, Editor, July 1998, pp. 225-233, doi: 10.1117/12.319841, (OJPS).